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Spectroscopic ellipsometry study of the In1-x Gax Asy P1-y / InP Heterojunctions grown by metalorganic chemical-vapor deposition
Drévillon, B.; Bertran Serra, Enric; Alnot, P.; Olivier, J.; Razeghi, M.
Universitat de Barcelona
Pel·lícules fines
El·lipsometria
Thin films
Ellipsometry
(c) American Institute of Physics , 1986
Article
info:eu-repo/semantics/publishedVersion
American Institute of Physics
         

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