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Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
Barroso, F.; Bosch i Puig, Salvador; Tort Escribà, Núria; Arteaga Barriel, Oriol; Sancho i Parramon, Jordi; Jover, Eric; Bertran Serra, Enric; Canillas i Biosca, Adolf
Universitat de Barcelona
El·lipsometria
Nanoestructures
Interferometria
Ellipsometry
Nanostructures
Interferometry
(c) Elsevier B.V., 2010
Article
info:eu-repo/semantics/acceptedVersion
Elsevier B.V.
         

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