To access the full text documents, please follow this link: http://hdl.handle.net/2445/24303

Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components
Duparré, Angela; Ferré Borrull, Josep; Gliech, Stefan; Notni, Gunther; Steinert, Jörg; Bennett, Jean M.
Universitat de Barcelona
2012-07-13
Òptica electrònica
Electron optics
(c) Optical Society of America, 2001
Article
Optical Society of America
         

Show full item record

Related documents

Other documents of the same author

Ristau, Detlev; Günster, Stefan; Bosch i Puig, Salvador; Duparré, Angela; Masetti, Enrico; Ferré Borrull, Josep; Kiriakidis, George; Peiró Martínez, Francisca; Quesnel, Etienne; Tihhonravov, Alexander
Wolf, T.; Gutmann, B.; Weber, H.; Ferré Borrull, Josep; Bosch i Puig, Salvador; Vallmitjana i Rico, Santiago
Sancho i Parramon, Jordi; Ferré Borrull, Josep; Bosch i Puig, Salvador; Ferrara, Maria Christina
 

Coordination

 

Supporters