Per accedir als documents amb el text complet, si us plau, seguiu el següent enllaç: http://hdl.handle.net/2445/24307

Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193 nm
Ferré Borrull, Josep; Duparré, Angela; Quesnel, Etienne
Universitat de Barcelona
Scattering characteristics of multilayer fluoride coatings for 193 nm deposited by ion beam sputtering and the related interfacial roughnesses are investigated. Quarter- and half-wave stacks of MgF2 and LaF3 with increasing thickness are deposited onto CaF2 and fused silica and are systematically characterized. Roughness measurements carried out by atomic force microscopy reveal the evolution of the power spectral densities of the interfaces with coating thickness. Backward-scattering measurements are presented, and the results are compared with theoretical predictions that use different models for the statistical correlation of interfacial roughnesses.
13-07-2012
Dispersió de la llum
Òptica electrònica
Light scattering
Electron optics
(c) Optical Society of America, 2000
Article
Optical Society of America
         

Mostra el registre complet del document

Documents relacionats

Altres documents del mateix autor/a

Ristau, Detlev; Günster, Stefan; Bosch i Puig, Salvador; Duparré, Angela; Masetti, Enrico; Ferré Borrull, Josep; Kiriakidis, George; Peiró Martínez, Francisca; Quesnel, Etienne; Tihhonravov, Alexander
Wolf, T.; Gutmann, B.; Weber, H.; Ferré Borrull, Josep; Bosch i Puig, Salvador; Vallmitjana i Rico, Santiago
Ferrari, Andrea C; Bonaccorso, Francesco; Fal'ko, Vladimir; Novoselov, Konstantin S; Roche, Stephan; Boggild, Peter; Borini, Frank H L; Palermo, Vincenzo; Pugno, Nicola; Garrido, Jose A; Sordan, Roman; Bianco, Alberto; Ballerini, Laura; Prato, Maurizio; Lidorikis, Elefterios; Kivioja, Jani; Marinelli, Claudio; Ryhanen, Tapani; Morpurgo, Alberto; Coleman, Jonathan N; Nicolosi, Valeria; Colombo, Luigi; Fert, Albert; Garcia-Hernandez, Mar; Bachtold, Adrian; Schneider, Gregory F; Guinea, Francisco; Dekker, Cees; Barbone, Matteo; Sun, Zhipei; Galiotis, Costas; Grigorenko, Alexander N; Konstantatos, Gerasimos; Kis, Andras; Katsnelson, Mikhail; Vandersypen, Lieven; Loiseau, Annick; Morandi, Vittorio; Neumaier, Daniel; Treossi, Emanuele; Pellegrini, Vittorio; Polini, Marco; Tredicucci, Alessandro; Williams, Gareth M; Hee Hong, Byung; Ahn, Jong-Hyun; Min Kim, Jong; Zirath, Herbert; van Wees, Bart J; van der Zant, Herre; Occhipinti, Luigi; Di Matteo, Andrea; Kinloch, Ian A; Seyller, Thomas; Quesnel, Etienne; Feng, Xinliang; Teo, Ken; Rupesinghe, Nalin; Hakonen, Pertti; Neil, Simon R T; Tannock, Quentin; Lofwander, Tomas; Kinaret, Jari