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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Martorell Cid, Ferran |
dc.contributor.author | Pons, M |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.contributor.author | Moll Echeto, Francisco de Borja |
dc.date | 2007 |
dc.identifier.citation | Martorell, F. [et al.]. Error probability in synchronous digital circuits due to power supply noise. A: International Conference on Design and Test of Integrated Circuits in Nanoscale Technology. "International Conference on Design and Test of Integrated Circuits in Nanoscale Technology". Rabat: ???, 2007, p. 170-175. |
dc.identifier.citation | 978-1-4244-1278-5 |
dc.identifier.citation | 10.1109/DTIS.2007.4449513 |
dc.identifier.uri | http://hdl.handle.net/2117/9653 |
dc.language.iso | eng |
dc.publisher | ??? |
dc.relation | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4449513 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Metal oxide semiconductors, Complementary |
dc.subject | Electronics |
dc.subject | Integrated circuits--Very large scale integration |
dc.subject | Electrònica |
dc.title | Error probability in synchronous digital circuits due to power supply noise |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |