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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Diaz Fortuny, Javier |
dc.contributor.author | Martin Martínez, Javier |
dc.contributor.author | Rodríguez Martínez, Rosana |
dc.contributor.author | Castro López, Rafael |
dc.contributor.author | Roca Moreno, Elisenda |
dc.contributor.author | Aragonès Cervera, Xavier |
dc.contributor.author | Barajas Ojeda, Enrique |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Fernández Fernández, Francisco V. |
dc.contributor.author | Nafría Maqueda, Montserrat |
dc.date | 2018-01-01 |
dc.identifier.citation | Diaz Fortuny, J., Martin, J., Rodríguez, R., Castro Lopez, R., Roca, E., Aragones, X., Barajas, E., Mateo, D., Fernández, F., Nafría, M. A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI. "IEEE journal of solid-state circuits", 1 Gener 2018, vol. 54, núm. 2, p. 476-488. |
dc.identifier.citation | 0018-9200 |
dc.identifier.citation | 10.1109/JSSC.2018.2881923 |
dc.identifier.uri | http://hdl.handle.net/2117/126049 |
dc.language.iso | eng |
dc.relation | https://ieeexplore.ieee.org/document/8563053 |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TEC2013-45638-C3-2-R |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TEC2016-75151-C3-2-R |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Integrated circuits |
dc.subject | Aging |
dc.subject | Bias temperature instability (BTI) |
dc.subject | CMOS |
dc.subject | Degradation |
dc.subject | Hot carrier injection (HCI) |
dc.subject | Negative BTI (NBTI) |
dc.subject | Positive BTI (PBTI) |
dc.subject | Random telegraph noise (RTN) |
dc.subject | Reliability |
dc.subject | Statistical characterization |
dc.subject | Variability. |
dc.subject | Circuits integrats |
dc.title | A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/article |
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