Títol: | Recovery of the MOSFET and circuit functionality after the dielectric breakdown of ultra-thin high-k gate stacks |
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Autor/a: | Crespo-Yepes, Albert; Martin Martinez, Javier; Rothschild, A.; Rodríguez Martínez, Rosana; Nafría i Maqueda, Montserrat; Aymerich Humet, Xavier |
Abstract: | |
Matèries: | -Dielectric breakdown -Dielectric breakdown reversibility -High-k -Resistive switching -CMOS circuits |
Drets: | open access
Tots els drets reservats. https://rightsstatements.org/vocab/InC/1.0/ |
Tipus de document: | Article |
Publicat per: | |
Compartir: | |
Uri: | https://ddd.uab.cat/record/138451 |