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dc.contributor | Barcelona Supercomputing Center |
---|---|
dc.contributor.author | Salami, Behzad |
dc.contributor.author | Unsal, Osman S. |
dc.contributor.author | Cristal Kestelman, Adrián |
dc.date | 2018-12-06 |
dc.identifier.citation | Salami, B.; Unsal, O. S.; Cristal, A. Fault Characterization Through FPGA Undervolting. A: "2018 28th International Conference on Field Programmable Logic and Applications (FPL)". IEEE, 2018, p. 85-88. |
dc.identifier.citation | 978-1-5386-8517-4 |
dc.identifier.citation | 10.1109/FPL.2018.00023 |
dc.identifier.uri | http://hdl.handle.net/2117/130488 |
dc.language.iso | eng |
dc.publisher | IEEE |
dc.relation | https://ieeexplore.ieee.org/document/8533473 |
dc.relation | info:eu-repo/grantAgreement/EC/H2020/780681/EU/Low Energy Toolset for Heterogeneous Computing/LEGaTO |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Informàtica |
dc.subject | High performance computing |
dc.subject | Field programmable gate arrays |
dc.subject | Circuit faults |
dc.subject | Voltage measurement |
dc.subject | Power demand |
dc.subject | Hardware |
dc.subject | Standards |
dc.subject | Temperature |
dc.subject | Supercomputadors |
dc.title | Fault Characterization Through FPGA Undervolting |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
dc.description.abstract |