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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Botaya Turón, Luis |
dc.contributor.author | Coromina, Xavier |
dc.contributor.author | Samitier i Martí, Josep |
dc.contributor.author | Puig i Vidal, Manuel |
dc.contributor.author | Otero Díaz, Jorge |
dc.date | 2017-06-28T15:22:51Z |
dc.date | 2017-06-28T15:22:51Z |
dc.date | 2016-05-25 |
dc.date | 2017-06-28T15:22:51Z |
dc.identifier.citation | 1424-8220 |
dc.identifier.citation | 668052 |
dc.identifier.uri | http://hdl.handle.net/2445/113042 |
dc.format | 9 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | MDPI |
dc.relation | Reproducció del document publicat a: https://doi.org/10.3390/s16060757 |
dc.relation | Sensors, 2016, vol. 16, num. 6, p. 757 |
dc.relation | https://doi.org/10.3390/s16060757 |
dc.rights | cc-by (c) Botaya Turón, Luis et al., 2016 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by/3.0/es |
dc.subject | Microscòpia d'efecte túnel |
dc.subject | Impedància (Electricitat) |
dc.subject | Quars |
dc.subject | Scanning tunneling microscopy |
dc.subject | Impedance (Electricity) |
dc.subject | Quartz |
dc.title | Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |