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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Balado Suárez, Luz María |
dc.contributor.author | Figueras Pàmies, Joan |
dc.date | 2016 |
dc.identifier.citation | Álvaro Gómez-Pau, Balado, L., Figueras, J. Criteria for selecting a subset of indirect measurements for analog testing. A: Conference on Design of Circuits and Integrated Systems. "2016 Conference on design of circuits and integrated systems (DCIS)". Granada: 2016, p. 1-6. |
dc.identifier.uri | http://hdl.handle.net/2117/99528 |
dc.language.iso | eng |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Processament del senyal::Filtres analògics i digitals |
dc.subject | Analog electronic systems--Testing |
dc.subject | Mixed signal circuits -- Testing |
dc.subject | Mixed-Signal Test |
dc.subject | Analog Test |
dc.subject | Alternate Test |
dc.subject | Indirect Measurements |
dc.subject | Alternate Feature Selection |
dc.subject | Signature Selection |
dc.subject | Measurements Selection |
dc.subject | Test Metrics |
dc.subject | Quadtrees |
dc.subject | Octrees |
dc.subject | Analog Filter |
dc.subject | Biquad Filter |
dc.subject | Filtres analògics -- Proves |
dc.subject | Circuits integrats mixtes -- Proves |
dc.title | Criteria for selecting a subset of indirect measurements for analog testing |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |