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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Balado Suárez, Luz María |
dc.contributor.author | Figueras Pàmies, Joan |
dc.date | 2016-09-01 |
dc.identifier.citation | Álvaro Gómez-Pau, Balado, L., Figueras, J. Indirect test of M-S circuits using multiple specification band guarding. "Integration. The VLSI journal", 1 Setembre 2016, vol. 55, p. 415-424. |
dc.identifier.citation | 0167-9260 |
dc.identifier.citation | 10.1016/j.vlsi.2016.04.007 |
dc.identifier.uri | http://hdl.handle.net/2117/99195 |
dc.language.iso | eng |
dc.relation | http://www.sciencedirect.com/science/article/pii/S0167926016300104 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics::Transistors |
dc.subject | Transistors |
dc.subject | Band guarding |
dc.subject | Multiple specification |
dc.subject | Mixed-signal testing |
dc.subject | Alternate test |
dc.subject | Indirect measurements |
dc.subject | Indirect measurements selection |
dc.subject | Test escapes |
dc.subject | Test yield loss |
dc.subject | Octrees |
dc.subject | Quadtrees |
dc.subject | Classifiers |
dc.subject | Butterworth filter |
dc.subject | Transistors |
dc.title | Indirect test of M-S circuits using multiple specification band guarding |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
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