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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors |
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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.contributor | Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors |
dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Rana, Manish |
dc.contributor.author | Canal Corretger, Ramon |
dc.contributor.author | Amat Bertran, Esteve |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2016 |
dc.identifier.citation | Rana, M., Canal, R., Amat, Esteve, Rubio, A. Statistical analysis and comparison of 2T and 3T1D e-DRAM minimum energy operation. A: IEEE International Symposium on On-Line Testing and Robust System Design. "2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS): 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols Catalunya, Spain". Sant Feliu de Guixols, Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 33-38. |
dc.identifier.citation | 978-1-5090-1506-1 |
dc.identifier.citation | 10.1109/IOLTS.2016.7604667 |
dc.identifier.uri | http://hdl.handle.net/2117/97275 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/document/7604667/ |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors |
dc.subject | Wearable technology -- Energy consumption |
dc.subject | DRAM chips |
dc.subject | Energy conservation |
dc.subject | SRAM chips |
dc.subject | Statistical analysis |
dc.subject | 2T1D e-DRAM |
dc.subject | 3T1D e-DRAM |
dc.subject | Biomedical wearable device |
dc.subject | Embedded-battery |
dc.subject | Energy-efficiency |
dc.subject | Minimum-energy point |
dc.subject | MEP |
dc.subject | Subthreshold voltages |
dc.subject | SRAM memory |
dc.subject | Noise margins |
dc.subject | Minimum energy operation |
dc.subject | Kriging metamodel |
dc.subject | Threshold voltage variation |
dc.subject | Size 32 nm |
dc.subject | Ordinadors portables -- Consum d'energia |
dc.title | Statistical analysis and comparison of 2T and 3T1D e-DRAM minimum energy operation |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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