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Título: | INFORMER: an integrated framework for early-stage memory robustness analysis |
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Autor/a: | Ganapathy, Shrikanth; Canal Corretger, Ramon; Alexandrescu, Dan; Costenaro, Eric; González Colás, Antonio María; Rubio Sola, Jose Antonio |
Otros autores: | Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors; Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
Abstract: | With the growing importance of parametric (process and environmental) variations in advanced technologies, it has become a serious challenge to design reliable, fast and low-power embedded memories. Adopting a variation-aware design paradigm requires a holistic perspective of memory-wide metrics such as yield, power and performance. However, accurate estimation of such metrics is largely dependent on circuit implementation styles, technology parameters and architecture-level specifics. In this paper, we propose a fully automated tool - INFORMER - that helps high-level designers estimate memory reliability metrics rapidly and accurately. The tool relies on accurate circuit-level simulations of failure mechanisms such as soft-errors and parametric failures. The statistics obtained can then help couple low-level metrics with higher-level design choices. A new technique for rapid estimation of low-probability failure events is also proposed. We present three use-cases of our prototype tool to demonstrate its diverse capabilities in autonomously guiding large SRAM based robust memory designs. © 2014 EDAA. |
Abstract: | Peer Reviewed |
Materia(s): | -Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats -Àrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics::Transistors -Circuits integrats -Transistors -SRAM chips -circuit simulation -failure analysis -integrated circuit reliability -radiation hardening (electronics) -Integrated circuits -Transistors |
Derechos: | Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Tipo de documento: | Artículo - Versión publicada Objeto de conferencia |
Editor: | European Interactive Digital Advertising Alliance (EDAA) |
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