Advanced applications of scanning electron microscopy in geology

Fecha de publicación

2012-09-28T14:15:14Z

2012-09-28T14:15:14Z

2012

Resumen

Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166


Nowadays Scanning Electron Microscopy (SEM) is a basic and fundamental tool in the study of geologic samples. The collision of a highlyaccelerated electron beam with the atoms of a solid sample results in the production of several radiation types than can be detected and analysed by specific detectors, providing information of the chemistry and crystallography of the studied material. From this point of view, the chamber of a SEM can be considered as a laboratory where different experiments can be carried out. The application of SEM to geology, especially in the fields of mineralogy and petrology has been summarised by Reed (1996).The aim of this paper is to show some recent applications in the characterization of geologic materials.

Tipo de documento

Capítulo o parte de libro


Versión publicada

Lengua

Inglés

Publicado por

Centres Científics i Tecnològics. Universitat de Barcelona

Documentos relacionados

Reproducció del document original

Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.5, 12 p.

http://hdl.handle.net/2445/32166

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Derechos

(c) Universitat de Barcelona, 2012