Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping

Fecha de publicación

2012-09-28T14:05:24Z

2012-09-28T14:05:24Z

2012

Resumen

Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166


Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM instruments of voltages 100 to 300 kV to turn them into true electron iffractometers, thus enabling electron crystallography. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscatter Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.

Tipo de documento

Capítulo o parte de libro


Versión publicada

Lengua

Inglés

Publicado por

Centres Científics i Tecnològics. Universitat de Barcelona

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Reproducció del document original

Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.3, 10 p.

http://hdl.handle.net/2445/32166

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Derechos

(c) Universitat de Barcelona, 2012