Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping

dc.contributor.author
Portillo i Serra, Joaquim
dc.date.issued
2012-09-28T14:05:24Z
dc.date.issued
2012-09-28T14:05:24Z
dc.date.issued
2012
dc.identifier
https://hdl.handle.net/2445/32145
dc.description.abstract
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
dc.description.abstract
Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM instruments of voltages 100 to 300 kV to turn them into true electron iffractometers, thus enabling electron crystallography. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscatter Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.
dc.format
10 p.
dc.format
application/pdf
dc.language
eng
dc.publisher
Centres Científics i Tecnològics. Universitat de Barcelona
dc.relation
Reproducció del document original
dc.relation
Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.3, 10 p.
dc.relation
http://hdl.handle.net/2445/32166
dc.rights
(c) Universitat de Barcelona, 2012
dc.rights
info:eu-repo/semantics/openAccess
dc.source
Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))
dc.subject
Microscòpia electrònica de transmissió
dc.subject
Anàlisi instrumental
dc.subject
Difracció d'electrons
dc.subject
Transmission electron microscopy
dc.subject
Instrumental analysis
dc.subject
Electrons diffraction
dc.title
Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping
dc.type
info:eu-repo/semantics/bookPart
dc.type
info:eu-repo/semantics/publishedVersion


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