dc.contributor.author
Coll Benejam, Catalina
dc.contributor.author
López Conesa, Lluís
dc.contributor.author
Rebled, J. M. (José Manuel)
dc.contributor.author
Magén, César
dc.contributor.author
Sánchez Barrera, Florencio
dc.contributor.author
Fontcuberta i Griñó, Josep
dc.contributor.author
Estradé Albiol, Sònia
dc.contributor.author
Peiró Martínez, Francisca
dc.date.issued
2018-10-02T09:34:10Z
dc.date.issued
2018-10-02T09:34:10Z
dc.date.issued
2017-04-06
dc.date.issued
2018-10-02T09:34:10Z
dc.identifier
https://hdl.handle.net/2445/124987
dc.description.abstract
LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images
dc.format
application/pdf
dc.publisher
American Chemical Society
dc.relation
Versió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b12484
dc.relation
Journal of Physical Chemistry C, 2017, vol. 121, num. 17, p. 9300-9304
dc.relation
https://doi.org/10.1021/acs.jpcc.6b12484
dc.rights
(c) American Chemical Society , 2017
dc.rights
info:eu-repo/semantics/openAccess
dc.source
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject
Pel·lícules fines
dc.title
Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films
dc.type
info:eu-repo/semantics/article
dc.type
info:eu-repo/semantics/acceptedVersion
