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Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films

Author

Coll Benejam, Catalina

López Conesa, Lluís

Rebled, J. M. (José Manuel)

Magén, César

Sánchez Barrera, Florencio

Fontcuberta i Griñó, Josep

Estradé Albiol, Sònia

Peiró Martínez, Francisca

Publication date

2018-10-02T09:34:10Z

2018-10-02T09:34:10Z

2017-04-06

2018-10-02T09:34:10Z

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Abstract

LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images

Document Type

Article

Accepted version

Language

English

Subjects and keywords

Pel·lícules fines; Thin films

Publisher

American Chemical Society

Related items

Versió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b12484

Journal of Physical Chemistry C, 2017, vol. 121, num. 17, p. 9300-9304

https://doi.org/10.1021/acs.jpcc.6b12484

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Rights

(c) American Chemical Society , 2017

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Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB) [75]

Enginyeria Electrònica i Biomèdica [781]

ISGlobal - Institut de Salut Global de Barcelona [60793]