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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Aragonès Cervera, Xavier |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Barajas Ojeda, Enrique |
dc.contributor.author | Crespo-Yepes, A. |
dc.contributor.author | Rodríguez Martínez, Rosana |
dc.contributor.author | Martin Martínez, Javier |
dc.contributor.author | Nafría Maqueda, Montserrat |
dc.date | 2019 |
dc.identifier.citation | Aragones, X. [et al.]. Aging in CMOS RF linear power amplifiers: experimental comparison and modeling. A: IEEE International Symposium on Circuits and Systems. "2019 IEEE International Symposium on Circuits and Systems (ISCAS): proceedings: 26-29 May 2019: Sapporo, Japan". Institute of Electrical and Electronics Engineers (IEEE), 2019, p. 1-5. |
dc.identifier.citation | 978-1-7281-0398-3 |
dc.identifier.citation | 10.1109/ISCAS.2019.8702100 |
dc.identifier.uri | http://hdl.handle.net/2117/143192 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | https://ieeexplore.ieee.org/document/8702100 |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TEC2013-45638-C3-2-R |
dc.relation | info:eu-repo/grantAgreement/ES/1PE/TEC2016-75151-C3-2-R |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència |
dc.subject | Power amplifiers |
dc.subject | Aging |
dc.subject | Reliability |
dc.subject | RF |
dc.subject | Power amplifier |
dc.subject | Amplificadors de potència |
dc.title | Aging in CMOS RF linear power amplifiers: experimental comparison and modeling |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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