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Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals
Levcenko, Sergiu; Hajdeu Chicarosh, Elena; Garcia Llamas, Elena; Caballero, Raquel; Serna, Rosalía; Bodnar, Ivan V.; Victorov, Ivan A.; Guc, Maxim; Merino, José Manuel; Pérez Rodríguez, Alejandro; Arushanov, Ernest; León, Máximo
Universitat de Barcelona
-El·lipsometria
-Dispositius optoelectrònics
-Propietats òptiques
-Ellipsometry
-Optoelectronic devices
-Optical properties
(c) American Institute of Physics , 2018
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Article - Published version
American Institute of Physics
         

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