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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor | Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.contributor.author | Reverter Cubarsí, Ferran |
dc.contributor.author | Perpiñà Gilabet, Xavier |
dc.contributor.author | Aragonès Cervera, Xavier |
dc.contributor.author | Jordà, Xavier |
dc.contributor.author | Vellvehi, Miquel |
dc.contributor.author | Mateo Peña, Diego |
dc.date | 2016 |
dc.identifier.citation | Altet, J., Rubio, A., Reverter, F., Perpiñà, X., Aragones, X., Jordà, X., Vellvehi, M., Mateo, D. Temperature sensors and measurements to test analogue circuits: questions and answers. A: International Mixed-Signal Testing Workshop. "2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016". Sant Feliu de Guixols, Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2016. |
dc.identifier.citation | 978-1-5090-2751-4 |
dc.identifier.citation | 10.1109/IMS3TW.2016.7524241 |
dc.identifier.uri | http://hdl.handle.net/2117/97135 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org.recursos.biblioteca.upc.edu/stamp/stamp.jsp?arnumber=7524241 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors |
dc.subject | Integrated circuits |
dc.subject | Temperature measurements |
dc.subject | Analogue circuits |
dc.subject | Integrated circuit testing |
dc.subject | Temperature measurement |
dc.subject | Temperature sensors |
dc.subject | Temperature sensors |
dc.subject | Analogue circuits |
dc.subject | Temperature measurements |
dc.subject | Integrated circuits |
dc.subject | Circuits integrats |
dc.subject | Termometria |
dc.title | Temperature sensors and measurements to test analogue circuits: questions and answers |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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