Title:
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Reliability: fallacy or reality?
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Author:
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González Colás, Antonio María; Mahlke, Scott; Mukherjee, Shubu; Sendag, Resit; Chiou, Derek; Yi, Joshua J.
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors; Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors |
Abstract:
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As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it. |
Abstract:
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Peer Reviewed |
Subject(s):
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-Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors -Integrated circuits -- Reliability -Circuits integrats -- Fiabilitat |
Rights:
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Document type:
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Article - Published version Article |
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