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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Carrasco, Juan A. |
dc.date | 2007-06-01 |
dc.identifier.citation | Carrasco, J. Corrections on “Failure Transition Distance-Based Importance Sampling Schemes for the Simulation of Repairable Fault-Tolerant Computer Systems". "IEEE transactions on reliability", 01 Juny 2007, vol. 56, núm. 2, p. 360. |
dc.identifier.citation | 0018-9529 |
dc.identifier.uri | http://hdl.handle.net/2117/23425 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Sistemes digitals programables |
dc.subject | Electric measurements - Instruments |
dc.subject | Electrònica--Mesuraments--Aparells i instruments |
dc.title | Corrections on “Failure Transition Distance-Based Importance Sampling Schemes for the Simulation of Repairable Fault-Tolerant Computer Systems" |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract |