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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
dc.contributor.author | Cuadras Tomàs, Àngel |
dc.contributor.author | Ovejas Benedicto, Victòria Júlia |
dc.contributor.author | Quílez Figuerola, Marcos |
dc.date | 2013 |
dc.identifier.citation | Cuadras, A.; Ovejas, V.; Quilez, M. Entropy as a wear out indicator: The resistor example. A: International Multi-Conference on Systems, Signals and Devices. "Proceedings of the 10th International Multi-Conference on Systems, Signals and Devices -SSD 2013". Hammamet: 2013, p. 1-5. |
dc.identifier.citation | 978-146736458-4 |
dc.identifier.citation | 10.1109/SSD.2013.6564142 |
dc.identifier.uri | http://hdl.handle.net/2117/22002 |
dc.language.iso | eng |
dc.relation | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6564142&tag=1 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | damage Entropy Joule effect reliability resistor |
dc.title | Entropy as a wear out indicator: The resistor example |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |