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Application of matched digital filters to noisy fringe-patterns from complex wavefronts;
Optical Measurement Systems for Industrial Inspection IV
Caum Aregay, Jesús; Arasa Marti, Jose; Royo Royo, Santiago; Ares Rodríguez, Miguel
Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.; Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria; Universitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica
Àrees temàtiques de la UPC::Enginyeria electrònica
Metrology
Digital filters
Diffraction patterns
Metrologia
Filtres digitals
Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/
info:eu-repo/semantics/publishedVersion
Article
Proc.SPIE Press
         

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