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Title:
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Design of a 20 GHz DPI method for SOIC8
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Author:
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Land, S.O.; Perdriau, R.; Ramdani, M.; Gil Galí, Ignacio; Lafon, F.
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group |
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Abstract:
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The direct power injection (DPI) test defined in
IEC 62132-4 measures the conducted immunity of integrated
circuits (ICs) up to 1 GHz. As the frequency of functional and
interference signals is increasing, we would like to characterise
immunity for higher frequencies as well.
In this paper, we show why typical IEC 62132-4 compliant
DPI set-ups become inaccurate when going up to 20 GHz. We
propose to determine the power Ptrans actually transmitted to
the device under test (DUT) by using offline short-open-load-thru
(SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we
design a low-cost FR4 printed circuit board (PCB) that allows
for testing of SOIC8-packaged ICs. We verify that this board
has acceptable and reproducible losses up to 20 GHz, as well as
acceptable crosstalk. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
-Integrated circuits
-Calibration
-Circuits integrats
-Calibratge |
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Rights:
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Document type:
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Article - Draft
Conference Object |
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Share:
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