Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping

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RECERCAT Home > Universitat de Barcelona > Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB) > Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2445/32145

dc.contributor	Universitat de Barcelona
dc.contributor.author	Portillo i Serra, Joaquim
dc.date	2012-09-28T14:05:24Z
dc.date	2012-09-28T14:05:24Z
dc.date	2012
dc.date.accessioned	2012-09-28T22:21:18Z
dc.date.available	2012-09-28T22:21:18Z
dc.date.issued	2012-09-28T22:21:18Z
dc.identifier.uri	http://hdl.handle.net/2445/32145
dc.format	10 p.
dc.format	application/pdf
dc.language.iso	eng
dc.publisher	Centres Científics i Tecnològics. Universitat de Barcelona
dc.relation	Reproducció del document original
dc.relation	Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.3, 10 p.
dc.relation	http://hdl.handle.net/2445/32166
dc.rights	(c) Universitat de Barcelona, 2012
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Microscòpia electrònica de transmissió
dc.subject	Anàlisi instrumental
dc.subject	Difracció d'electrons
dc.subject	Transmission electron microscopy
dc.subject	Instrumental analysis
dc.subject	Electrons diffraction
dc.title	Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping
dc.type	info:eu-repo/semantics/bookPart
dc.description.abstract	Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematicalconditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEMinstruments of voltages 100 to 300 kV to turn them into true electron iffractometers, thus enabling electron crystallography. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscatter Diffraction (EBSD) technique in Scanning ElectronMicroscopes (SEM) at lower magnifications and longer acquisition times.
dc.description.abstract	Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166

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