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Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping
Portillo i Serra, Joaquim
Universitat de Barcelona
Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematicalconditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEMinstruments of voltages 100 to 300 kV to turn them into true electron iffractometers, thus enabling electron crystallography. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscatter Diffraction (EBSD) technique in Scanning ElectronMicroscopes (SEM) at lower magnifications and longer acquisition times.
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
2012-09-28
Microscòpia electrònica de transmissió
Anàlisi instrumental
Difracció d'electrons
Transmission electron microscopy
Instrumental analysis
Electrons diffraction
(c) Universitat de Barcelona, 2012
info:eu-repo/semantics/bookPart
Centres Científics i Tecnològics. Universitat de Barcelona
         

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