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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica |
dc.contributor.author | Jauregui Tellería, Ricardo |
dc.contributor.author | Silva Martínez, Fernando |
dc.contributor.author | Orlandi, Antonio |
dc.contributor.author | Sasse, Hugh |
dc.contributor.author | Duffy, Alistair |
dc.date | 2010 |
dc.identifier.citation | Jauregui, R. [et al.]. Factors influencing the successful validation of transient phenomenon modelling. A: Asia-Pacific International Symposium on Electromagnetic Compatibility. "The 2010 Asia-Pacific Electromagnetic Compatibility Symposium and Technical Exhibition". Beijing: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 338-341. |
dc.identifier.citation | 10.1109/APEMC.2010.5475513 |
dc.identifier.uri | http://hdl.handle.net/2117/10168 |
dc.language.iso | eng |
dc.publisher | IEEE Press. Institute of Electrical and Electronics Engineers |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència |
dc.subject | Computational electromagnetics simulation |
dc.subject | Electromagnetic interference |
dc.subject | IEEE standards1597.1 |
dc.subject | Frequency-domain analysis |
dc.subject | Electromagnetisme -- Simulació per ordinador |
dc.title | Factors influencing the successful validation of transient phenomenon modelling |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
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