Dynamic compact thermal models with multiple power sources: application to an ultrathin chip stacking technology

Publication date

2009-06-19T07:43:33Z

2009-06-19T07:43:33Z

2005

Abstract

Whereas numerical modeling using finite-element methods (FEM) can provide transient temperature distribution in the component with enough accuracy, it is of the most importance the development of compact dynamic thermal models that can be used for electrothermal simulation. While in most cases single power sources are considered, here we focus on the simultaneous presence of multiple sources. The thermal model will be in the form of a thermal impedance matrix containing the thermal impedance transfer functions between two arbitrary ports. Each individual transfer function element ( ) is obtained from the analysis of the thermal temperature transient at node ¿ ¿ after a power step at node ¿ .¿ Different options for multiexponential transient analysis are detailed and compared. Among the options explored, small thermal models can be obtained by constrained nonlinear least squares (NLSQ) methods if the order is selected properly using validation signals. The methods are applied to the extraction of dynamic compact thermal models for a new ultrathin chip stack technology (UTCS).

Document Type

Article


Published version

Language

English

Publisher

IEEE

Related items

Reproducció del document publicat a http://dx.doi.org/10.1109/TADVP.2005.850507

IEEE Transactions on Advanced Packaging, 2005, vol. 28, núm. 4, p. 694-703.

http://dx.doi.org/10.1109/TADVP.2005.850507

Recommended citation

This citation was generated automatically.

Rights

(c) IEEE, 2005

This item appears in the following Collection(s)