dc.contributor.author
Oncins Marco, Gerard
dc.contributor.author
Díaz Marcos, Jordi
dc.date.issued
2012-10-01T08:20:05Z
dc.date.issued
2012-10-01T08:20:05Z
dc.identifier
https://hdl.handle.net/2445/32162
dc.description.abstract
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
dc.description.abstract
Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works
performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments.
dc.format
application/pdf
dc.publisher
Centres Científics i Tecnològics. Universitat de Barcelona
dc.relation
Reproducció del document original
dc.relation
Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.7, 10 p.
dc.relation
http://hdl.handle.net/2445/32166
dc.rights
(c) Universitat de Barcelona, 2012
dc.rights
info:eu-repo/semantics/openAccess
dc.source
Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))
dc.subject
Microscòpia de força atòmica
dc.subject
Nanotecnologia
dc.subject
Anàlisi instrumental
dc.subject
Atomic force microscopy
dc.subject
Nanotechnology
dc.subject
Instrumental analysis
dc.title
Atomic force microscopy: probing the nanoworld
dc.type
info:eu-repo/semantics/bookPart
dc.type
info:eu-repo/semantics/publishedVersion
