Atomic force microscopy: probing the nanoworld

Publication date

2012-10-01T08:20:05Z

2012-10-01T08:20:05Z

2012

Abstract

Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166


Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments.

Document Type

Chapter or part of a book


Published version

Language

English

Publisher

Centres Científics i Tecnològics. Universitat de Barcelona

Related items

Reproducció del document original

Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.7, 10 p.

http://hdl.handle.net/2445/32166

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Rights

(c) Universitat de Barcelona, 2012