Magnetization reversal and magnetic anisotropies in epitaxial Fe/MgO and Fe/MgO/Fe heterostructures grown on Si(001)

Fecha de publicación

2012-05-03T08:13:40Z

2012-05-03T08:13:40Z

2003-02-15

2012-04-20T11:16:19Z

Resumen

Epitaxial Fe/MgO heterostructures have been grown on Si(001) by a combination of sputtering and laser ablation deposition techniques. The growth of MgO on Si(001) is mainly determined by the nature of the interface, with large lattice mismatch and the presence of an amorphous layer of unclear origin. Reflection high energy electron diffraction patterns of this MgO buffer layer are characteristic of an epitaxial, but disordered, structure. The structural quality of subsequent Fe and MgO layers continuously improves due to the better lattice match and the burial of defects. A weak uniaxial in-plane magnetic anisotropy is found superimposed on the expected cubic biaxial anisotropy. This additional anisotropy, of interfacial nature and often found in Fe/MgO and Fe/MgO/GaAs(001) systems, is less intense here due to the poorer MgO/Si interface quality compared with that of other systems. From the evolution of the anisotropy field with film thickness, magnetic anisotropy is also found to depend on the crystal quality. Kerr measurements of a Fe/MgO multilayered structure grown on Si show two different switching fields, suggesting magnetic coupling of two of the three Fe layers. Nevertheless, due to the little sensitivity to the bottom Fe film, independent switching of the three layers cannot be ruled out.

Tipo de documento

Artículo


Versión publicada

Lengua

Inglés

Publicado por

American Institute of Physics

Documentos relacionados

Reproducció del document publicat a: http://dx.doi.org/10.1063/1.1538317

Journal of Applied Physics, 2003, vol. 93, núm. 4, p. 2126-2134

http://dx.doi.org/10.1063/1.1538317

Citación recomendada

Esta citación se ha generado automáticamente.

Derechos

(c) American Institute of Physics, 2003

Este ítem aparece en la(s) siguiente(s) colección(ones)