Energy transfer mechanism and Auger effect in Er3+ coupled silicon nanoparticle samples

Publication date

2011-01-25T12:51:43Z

2011-01-25T12:51:43Z

2010-09-13

2011-01-14T13:50:56Z

Abstract

We report a spectroscopic study about the energy transfer mechanism among silicon nanoparticles (Si-np), both amorphous and crystalline, and Er ions in a silicon dioxide matrix. From infrared spectroscopic analysis, we have determined that the physics of the transfer mechanism does not depend on the Si-np nature, finding a fast (< 200 ns) energy transfer in both cases, while the amorphous nanoclusters reveal a larger transfer efficiency than the nanocrystals. Moreover, the detailed spectroscopic results in the visible range here reported are essential to understand the physics behind the sensitization effect, whose knowledge assumes a crucial role to enhance the transfer rate and possibly employing the material in optical amplifier devices. Joining the experimental data, performed with pulsed and continuous-wave excitation, we develop a model in which the internal intraband recombination within Si-np is competitive with the transfer process via an Auger electron"recycling" effect. Posing a different light on some detrimental mechanism such as Auger processes, our findings clearly recast the role of Si-np in the sensitization scheme, where they are able to excite very efficiently ions in close proximity to their surface. (C) 2010 American Institute of Physics.

Document Type

Article


Published version

Language

English

Publisher

American Institute of Physics

Related items

Reproducció del document publicat a: http://dx.doi.org/10.1063/1.3476286

Journal of Applied Physics, 2010, vol. 108, núm. 5, p. 53518-1-53518-8

http://dx.doi.org/10.1063/1.3476286

info:eu-repo/grantAgreement/EC/FP7/224312/EU//HELIOS

info:eu-repo/grantAgreement/EC/FP6/033574/EU//LANCER

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(c) American Institute of Physics, 2010

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