Resistive switching and charge transport mechanisms in ITO/ZnO/p-Si devices

dc.contributor.author
Blázquez Gómez, Josep Oriol
dc.contributor.author
Frieiro Castro, Juan Luis
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López Vidrier, Julià
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Guillaume, Clément
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Portier, Xavier
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Labbé, Christophe
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Sanchis, Pablo
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Hernández Márquez, Sergi
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Garrido Fernández, Blas
dc.date.issued
2020-01-20T11:08:12Z
dc.date.issued
2020-01-20T11:08:12Z
dc.date.issued
2018-10-29
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2020-01-20T11:08:12Z
dc.identifier
0003-6951
dc.identifier
https://hdl.handle.net/2445/148184
dc.identifier
682896
dc.description.abstract
The resistive switching properties of ITO/ZnO/p-Si devices have been studied, which present welldefined resistance states with more than five orders of magnitude difference in current. Both the high resistance state (HRS) and the low resistance state (LRS) were induced by either sweeping or pulsing the voltage, observing some differences in the HRS. Finally, the charge transport mechanisms dominating the pristine, HRS, and LRS states have been analyzed in depth, and the obtained structural parameters suggest a partial re-oxidation of the conductive nanofilaments and a reduction of the effective conductive area. Published by AIP Publishing. https://doi.org/10.1063/1.5046911
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5 p.
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application/pdf
dc.language
eng
dc.publisher
American Institute of Physics
dc.relation
Reproducció del document publicat a: https://doi.org/10.1063/1.5046911
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Applied Physics Letters, 2018, vol. 113, num. 183502
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https://doi.org/10.1063/1.5046911
dc.rights
(c) American Institute of Physics , 2018
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info:eu-repo/semantics/openAccess
dc.source
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject
Òxid de zinc
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Pel·lícules fines
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Teoria de la commutació
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Nanoelectrònica
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Zinc oxide
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Thin films
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Switching theory
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Nanoelectronics
dc.title
Resistive switching and charge transport mechanisms in ITO/ZnO/p-Si devices
dc.type
info:eu-repo/semantics/article
dc.type
info:eu-repo/semantics/publishedVersion


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