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Characterizing fault propagation in safety-critical processor designs
Espinosa, Jaime; Hernandez, Carles; Abella, Jaume
Barcelona Supercomputing Center
Achieving reduced time-to-market in modern electronic designs targeting safety critical applications is becoming very challenging, as these designs need to go through a certification step that introduces a non-negligible overhead in the verification and validation process. To cope with this challenge, safety-critical systems industry is demanding new tools and methodologies allowing quick and cost-effective means for robustness verification. Microarchitectural simulators have been widely used to test reliability properties in different domains but their use in the process of robustness verification remains yet to be validated against other accepted methods such as RTL or gate-level simulation. In this paper we perform fault injections in an RTL model of a processor to characterize fault propagation. The results and conclusions of this characterization will serve to devise to what extent fault injection methodologies for robustness verification using microarchitectural simulators can be employed.
The research leading to these results has received funding from the ARTEMIS Joint Undertaking VeTeSS project under grant agreement number 295311. This work has also been funded by the Ministry of Economy and Competitiveness of Spain under contract TIN2012-34557 and HiPEAC. Jaume Abella is partially supported by the Ministry of Economy and Competitiveness under Ramon y Cajal postdoctoral fellowship number RYC-2013-14717.
Peer Reviewed
Àrees temàtiques de la UPC::Enginyeria electrònica
Simulation and Modeling
Electronic systems
Benchmark testing
Circuit faults
Logic gates
Digital simulation
Safety-critical software
Simulació, Mètodes de
Sistemes electrònics de seguretat
Institute of Electrical and Electronics Engineers (IEEE)

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