Relaxor ferroelectrics (RF) are outstanding materials owing to their extraordinary dielectric, electromechanical, and electro-optical properties. Although their massive applications, they remain to be one of the most puzzling solid-state materials because understanding their structural local order and relaxation dynamics is being a long-term challenge in materials science. The so-called Vogel-Fulcher-Tamman (VFT) relation has been extensively used to parameterize the relaxation dynamics in RF, although no microscopic description has been firmly established for such empirical relation. Here, we show that VFT equation is not always a proper approach for describing the dielectric relaxation in RF. Based on the Adam-Gibbs model and the Grüneisen temperature index, a more general equation to disentangle the relaxation kinetic is proposed. This approach allows to a new formulation for the configurational entropy leading to a local structural heterogeneity related order parameter for RF. A new pathway to disentangle relaxation phenomena in other relaxor ferroics could have opened.