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Título:	L-Band vegetation optical depth for crop phenology monitoring and crop yield assessment
Autor/a:	Chaparro Danon, David; Piles Guillem, Maria; Vall-Llossera Ferran, Mercedes Magdalena; Camps Carmona, Adriano José; Konings, Alexandra G.; Entekhabi, Dara; Jagdhuber, Thomas
Otros autores:	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. CTE-CRAE - Grup de Recerca en Ciències i Tecnologies de l'Espai; Universitat Politècnica de Catalunya. RSLAB - Grup de Recerca en Teledetecció
Abstract:	Vegetation Optical Depth (VOD) at L-band is highly sensitive to the water content and above-ground biomass of vegetation. Hence, it has great potential for monitoring crop phenology and for providing crop yield forecasts. Recently, the Multi-Temporal Dual Channel Algorithm (MT -DCA) has been proposed to retrieve L-band VOD from Soil Moisture Active Passive (SMAP) measurements. In previous research, SMAP VOD has been compared to crop phenology and has been used to derive crop yield estimates. Here, we review and expand these initial research studies. In particular, we quantify the capability of VOD to detect different crop stages, and test different VOD metrics (i.e., maximum, range and integrals of VOD) to provide crop yield estimates in the United States Corn Belt. Results show that VOD captures 50% to 70% of crop changes during growing and maturing phases, and that it explains between 44% (in heterogeneous crop regions) and 74% (in homogenous croplands) of final crop yields.
Abstract:	Peer Reviewed
Materia(s):	-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Teledetecció -Àrees temàtiques de la UPC::Enginyeria agroalimentària -Remote sensing -Enginyeria agronòmica -Yield forecasts -Crop phenology -VOD -SMAP -Agro-ecosystems -Teledetecció -Agricultural engineering
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Tipo de documento:	Artículo - Versión publicada Objeto de conferencia
Editor:	Institute of Electrical and Electronics Engineers (IEEE)
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