Evidence of a minoritary monoclinic LaNiO<sub>2.5</sub> phase in lanthanum nickelate thin films

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RECERCAT Home > Universitat de Barcelona > Enginyeria Electrònica i Biomèdica > Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2445/128199

dc.contributor	Universitat de Barcelona
dc.contributor.author	López Conesa, Lluís
dc.contributor.author	Rebled, J. M. (José Manuel)
dc.contributor.author	Pesquera, David
dc.contributor.author	Dix, Nico
dc.contributor.author	Sánchez, Florencio
dc.contributor.author	Herranz, Gervasi
dc.contributor.author	Fontcuberta, Josep
dc.contributor.author	Magén, César
dc.contributor.author	Casanove, Marie Jose
dc.contributor.author	Estradé Albiol, Sònia
dc.contributor.author	Peiró Martínez, Francisca
dc.date	2019-02-13T11:18:28Z
dc.date	2019-02-13T11:18:28Z
dc.date	2017-03-07
dc.date	2019-02-13T11:18:28Z
dc.identifier.citation	1463-9076
dc.identifier.citation	670895
dc.identifier.uri	http://hdl.handle.net/2445/128199
dc.format	6 p.
dc.format	application/pdf
dc.language.iso	eng
dc.publisher	Royal Society of Chemistry
dc.relation	Versió postprint del document publicat a: https://doi.org/10.1039/c7cp00902j
dc.relation	Physical Chemistry Chemical Physics, 2017, vol. 19, num. 13, p. 9137-9142
dc.relation	https://doi.org/10.1039/c7cp00902j
dc.rights	(c) López Conesa, Lluís et al., 2017
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Ciència dels materials
dc.subject	Cristal·lografia
dc.subject	Pel·lícules fines
dc.subject	Òxids metàl·lics
dc.subject	Estructura electrònica
dc.subject	Materials science
dc.subject	Crystallography
dc.subject	Thin films
dc.subject	Metallic oxides
dc.subject	Electronic structure
dc.title	Evidence of a minoritary monoclinic LaNiO<sub>2.5</sub> phase in lanthanum nickelate thin films
dc.type	info:eu-repo/semantics/article
dc.type	info:eu-repo/semantics/acceptedVersion
dc.description.abstract	LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied using High Resolution Transmission Electron Microscopy (HRTEM) and High Angle Annular Dark Field (HAADF) imaging. The strain state of the films is studied using Geometric Phase Analysis (GPA). Results show the successful in-plane adaptation of the films to the substrates, both in the compressive (LAO) and tensile (LSAT) cases. Through the systematic analysis of HRTEM superstructure contrast modulation along different crystal orientations, localized regions of the monoclinic LaNiO2.5 phase are detected in the 35 nm films.

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