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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors |
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dc.contributor | Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors |
dc.contributor.author | Abella Ferrer, Jaume |
dc.contributor.author | Vera Rivera, Francisco Javier |
dc.contributor.author | Unsal, Osman Sabri |
dc.contributor.author | Ergin, Oguz |
dc.contributor.author | González Colás, Antonio María |
dc.date | 2007 |
dc.identifier.citation | Abella, J., Vera, X., Unsal, O., Ergin, O., González, A. Fuse: A technique to anticipate failures due to degradation in ALUs. A: IEEE International On-Line Testing Symposium. "IOLTS 2007: 13th IEEE International On-Line Testing Symposium: Heraklion, Crete, Greece 8–11 July 2007: proceedings". Hersonissos-Heraklion, Crete: Institute of Electrical and Electronics Engineers (IEEE), 2007, p. 15-22. |
dc.identifier.citation | 978-0-7695-2918-9 |
dc.identifier.citation | 10.1109/IOLTS.2007.34 |
dc.identifier.uri | http://hdl.handle.net/2117/96791 |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.relation | http://ieeexplore.ieee.org/document/4274815/ |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
dc.subject | Integrated circuits -- Reliability |
dc.subject | Microprocessors |
dc.subject | Fuses |
dc.subject | Degradation |
dc.subject | Adders |
dc.subject | Computer crashes |
dc.subject | Transistors |
dc.subject | Protection |
dc.subject | Circuits |
dc.subject | Hardware |
dc.subject | Wires |
dc.subject | Temperature |
dc.subject | Circuits integrats -- Fiabilitat |
dc.subject | Microprocessadors |
dc.title | Fuse: A technique to anticipate failures due to degradation in ALUs |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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