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Title:	Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy
Author:	Van Der Hofstadt, Marc; Fabregas, Rene; Biagi, Maria Chiara; Fumagalli, Laura, 1959-; Gomila Lluch, Gabriel
Abstract:	Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to study the local dielectric properties of non-planar samples. Here we present the quantitative analysis of this imaging mode. We introduce a method to quantify and subtract the topographic crosstalk from the lift-mode EFM images, and a 3D numerical approach that allows for extracting the local dielectric constant with nanoscale spatial resolution free from topographic artifacts. We demonstrate this procedure by measuring the dielectric properties of micropatterned SiO2 pillars and of single bacteria cells, thus illustrating the wide applicability of our approach from materials science to biology.
Subject(s):	-Dielèctrics -Nanotecnologia -Microscòpia de força atòmica -Dielectrics -Nanotechnology -Atomic force microscopy
Rights:	(c) Institute of Physics (IOP), 2016
Document type:	Article Article - Accepted version
Published by:	Institute of Physics (IOP)
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