Extensive domain wall contribution to strain in a (K,Na)NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction

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dc.contributor	Universitat Politècnica de Catalunya. Departament de Física
dc.contributor	Universitat Politècnica de Catalunya. CEMAD - Caracterització Elèctrica de Materials i Dispositius
dc.contributor.author	Ochoa Guerrero, Diego A.
dc.contributor.author	Esteves, Giovanni
dc.contributor.author	Iamsasri, Thanakorn
dc.contributor.author	Rubio-Marcos, Fernando
dc.contributor.author	Fernández Lozano, José Francisco
dc.contributor.author	García García, José Eduardo
dc.contributor.author	Jones, Jacob L.
dc.date	2016-08
dc.identifier.citation	Ochoa, D. A., Esteves, G., Iamsasri, T., Rubio-Marcos, F., Fernández, J.F., Garcia, J. E., Jones, J.L. Extensive domain wall contribution to strain in a (K,Na)NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction. "Journal of the european ceramic society", Agost 2016, vol. 36, núm. 10, p. 2489-2494.
dc.identifier.citation	0955-2219
dc.identifier.citation	10.1016/j.jeurceramsoc.2016.03.022
dc.identifier.uri	http://hdl.handle.net/2117/86801
dc.language.iso	eng
dc.publisher	Elsevier
dc.relation	http://www.sciencedirect.com/science/article/pii/S095522191630139X
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject	Àrees temàtiques de la UPC::Física
dc.subject	Piezoelectric ceramics
dc.subject	Ferroelectric crystals
dc.subject	X-Ray Diffraction
dc.subject	piezoceramics
dc.subject	ferroelectrics
dc.subject	X-ray diffraction
dc.subject	KNN
dc.subject	domain walls
dc.subject	Raigs X--Difracció
dc.subject	Ceràmica piezoelèctrica
dc.subject	Ferroelectricitat
dc.title	Extensive domain wall contribution to strain in a (K,Na)NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction
dc.type	info:eu-repo/semantics/submittedVersion
dc.type	info:eu-repo/semantics/article
dc.description.abstract	The origins of high piezoelectric properties in the lead-free (K,Na)NbO3-based tetragonal composition (K0.44Na0.52Li0.04)(Nb0.86Ta0.10Sb0.04)O3 (KNL-NTS) is investigated by quantifying the intrinsic and extrinsic contributions from high energy X-ray diffraction measurements. The applied methodology, which allows discerning between the intrinsic contribution, related to the field induced lattice distortion, and the extrinsic contributions, related to non-180° domain wall motion, is widely described in this work. The non-180° domain reorientation of the KNL-NTS piezoceramic is quantify from the integrated intensities of the 002 and 200 reflections obtained from line profile, while the shifts in peak position versus the applied electric field is used to obtain the lattice strain contribution. Large non-180° domain wall contribution to the electric field induced macroscopic strain (80% of the macroscopic strain) is verified in KNL-NTS.

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