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dc.contributor | Institut de Recerca en Energía de Catalunya |
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dc.contributor.author | Olar, Tetiana |
dc.contributor.author | Lauermann, Iver |
dc.contributor.author | Haibing, Xie |
dc.contributor.author | Neuschitzer, Markus |
dc.contributor.author | Saucedo, Edgardo |
dc.contributor.author | Calvet, Wolfram |
dc.contributor.author | Steigert, Alexander |
dc.contributor.author | Ümsür, Bünyamin |
dc.contributor.author | Chacko, Binoy |
dc.contributor.author | Parvan, Vladimir |
dc.contributor.author | Gorgoi, Mihaela |
dc.contributor.author | Senkovskiy, Boris |
dc.contributor.author | Lux-Steiner, Martha Ch. |
dc.date | 2015 |
dc.identifier.citation | Olar, T. [et al.]. Assessment of Chemical and Electronic Surface Properties of the Cu2ZnSn(SSe)4 after Different Etching Procedures by Synchrotron-based Spectroscopies. "", 2015, vol. 84, p. 8-16. |
dc.identifier.citation | 18766102 |
dc.identifier.citation | 10.1016/j.egypro.2015.12.289 |
dc.identifier.uri | http://hdl.handle.net/2117/102653 |
dc.language.iso | eng |
dc.publisher | Elsevier Ltd |
dc.relation | http://ac.els-cdn.com/S1876610215029549/1-s2.0-S1876610215029549-main.pdf?_tid=b0139458-0d5e-11e7-8ce0-00000aacb360&acdnat=1490008779_db4365b3c479a6a02e29d08f687341f4 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria dels materials |
dc.subject | Absorption spectroscopy |
dc.subject | Conduction bands |
dc.subject | Copper |
dc.subject | Energy gap |
dc.subject | Etching |
dc.subject | Heterojunctions |
dc.subject | Semiconducting selenium compounds |
dc.subject | Surfaces |
dc.subject | Thin film solar cells |
dc.subject | Tin |
dc.subject | X ray absorption |
dc.subject | X ray absorption fine structure spectroscopy |
dc.subject | X ray absorption near edge structure spectroscopy |
dc.subject | Zinc |
dc.subject | Zinc sulfide |
dc.title | Assessment of Chemical and Electronic Surface Properties of the Cu2ZnSn(SSe)4 after Different Etching Procedures by Synchrotron-based Spectroscopies |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |
dc.description.abstract | |
dc.description.abstract |