dc.contributor.author
Gomila Lluch, Gabriel
dc.contributor.author
Pennetta, C.
dc.contributor.author
Reggiani, L. (Lino), 1941-
dc.contributor.author
Ferrari, G.
dc.contributor.author
Sampietro, M.
dc.contributor.author
Bertuccio, G.
dc.date.issued
2010-06-25T08:26:54Z
dc.date.issued
2010-06-25T08:26:54Z
dc.identifier
https://hdl.handle.net/2445/13170
dc.description.abstract
We report on direct experimental evidence of shot noise in a linear macroscopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffusive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. The present results show that neither potential barriers nor the absence of inelastic scattering are necessary to observe shot noise in electronic devices.
dc.format
application/pdf
dc.publisher
American Physical Society
dc.relation
Reproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevLett.92.226601
dc.relation
Physical Review Letters, 2004, vol. 92, núm. 22, p. 226601-1-226601-4
dc.relation
http://dx.doi.org/10.1103/PhysRevLett.92.226601
dc.rights
(c) American Physical Society, 2004
dc.rights
info:eu-repo/semantics/openAccess
dc.source
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject
Enginyeria elèctrica
dc.subject
Electric engineering
dc.title
Shot noise in linear macroscopic resistors
dc.type
info:eu-repo/semantics/article
dc.type
info:eu-repo/semantics/publishedVersion
