Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals

dc.contributor.author
León, Máximo
dc.contributor.author
Levcenko, Sergiu
dc.contributor.author
Serna, Rosalía
dc.contributor.author
Bodnar, Ivan V.
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Nateprov, A.
dc.contributor.author
Guc, Maxim
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Gurieva, G.
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Lopez, N.
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Merino, José Manuel
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Caballero, Raquel
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Schorr, S.
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Pérez Rodríguez, Alejandro
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Arushanov, Ernest
dc.date.issued
2018-09-26T10:40:18Z
dc.date.issued
2018-09-26T10:40:18Z
dc.date.issued
2014-08-15
dc.date.issued
2018-09-26T10:40:18Z
dc.identifier
0003-6951
dc.identifier
https://hdl.handle.net/2445/124830
dc.identifier
645135
dc.description.abstract
Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8-4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8-4.5 eV photon energy range
dc.format
5 p.
dc.format
application/pdf
dc.language
eng
dc.publisher
American Institute of Physics
dc.relation
Reproducció del document publicat a: https://doi.org/10.1063/1.4892548
dc.relation
Applied Physics Letters, 2014, vol. 105, p. 061909-1-061909-4
dc.relation
https://doi.org/10.1063/1.4892548
dc.rights
(c) American Institute of Physics , 2014
dc.rights
info:eu-repo/semantics/openAccess
dc.source
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject
Cristal·lografia
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El·lipsometria
dc.subject
Crystallography
dc.subject
Ellipsometry
dc.title
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals
dc.type
info:eu-repo/semantics/article
dc.type
info:eu-repo/semantics/publishedVersion


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