Fractional exclusion statistics and shot noise in ballistic conductors

dc.contributor.author
Gomila Lluch, Gabriel
dc.contributor.author
Reggiani, L. (Lino), 1941-
dc.date.issued
2009-12-28T11:22:57Z
dc.date.issued
2009-12-28T11:22:57Z
dc.date.issued
2001
dc.identifier
0163-1829
dc.identifier
https://hdl.handle.net/2445/10601
dc.identifier
526802
dc.description.abstract
We study the noise properties of ballistic conductors with carriers satisfying fractional exclusion statistics. To test directly the nature of exclusion statistics we found that systems under weakly degenerate conditions should be considered. Typical of these systems is that the chemical potential $\ensuremath{\mu}$ is in the thermal range $|\ensuremath{\mu}|l{3k}_{B}T.$ In these conditions the noise properties under current saturation are found to depend upon the statistical parameter g, displaying suppressed shot noise for $1/2l~gl~1,$ and enhanced shot noise for $0lgl1/2,$ according to the attractive or repulsive nature of the carrier exclusion statistics.
dc.format
6 p.
dc.format
application/pdf
dc.format
application/pdf
dc.language
eng
dc.publisher
The American Physical Society
dc.relation
Reproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.63.165404
dc.relation
Physical Review B, 2001, vol. 63, núm. 16, p. 165404-1-165404-6
dc.relation
http://doi.org/10.1103/PhysRevB.63.165404
dc.rights
(c) The American Physical Society, 2001
dc.rights
info:eu-repo/semantics/openAccess
dc.source
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject
Fluctuations (Physics)
dc.subject
Soroll electrònic
dc.subject
Semiconductors
dc.subject
Fluctuacions (Física)
dc.subject
Electronic noise
dc.subject
Semiconductors
dc.title
Fractional exclusion statistics and shot noise in ballistic conductors
dc.type
info:eu-repo/semantics/article
dc.type
info:eu-repo/semantics/publishedVersion


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