Título:
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On the power of symmetric linear programs
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Autor/a:
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Atserias, Albert; Dawar, Anuj; Ochremiak, Joanna
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Otros autores:
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Universitat Politècnica de Catalunya. Departament de Ciències de la Computació; Universitat Politècnica de Catalunya. ALBCOM - Algorismia, Bioinformàtica, Complexitat i Mètodes Formals |
Abstract:
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Abstract:
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We consider families of symmetric linear programs (LPs) that decide a property of graphs (or other relational structures) in the sense that, for each size of graph, there is an LP defining a polyhedral lift that separates the integer points corresponding to graphs with the property from those corresponding to graphs without the property. We show that this is equivalent, with at most polynomial blow-up in size, to families of symmetric Boolean circuits with threshold gates. In particular, when we consider polynomial-size LPs, the model is equivalent to definability in a non-uniform version of fixed-point logic with counting (FPC). Known upper and lower bounds for FPC apply to the non-uniform version. In particular, this implies that the class of graphs with perfect matchings has polynomial-size symmetric LPs while we obtain an exponential lower bound for symmetric LPs for the class of Hamiltonian graphs. We compare and contrast this with previous results (Yannakakis 1991) showing that any symmetric LPs for the matching and TSP polytopes have exponential size. As an application, we establish that for random, uniformly distributed graphs, polynomial-size symmetric LPs are as powerful as general Boolean circuits. We illustrate the effect of this on the well-studied planted-clique problem. |
Abstract:
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Peer Reviewed |
Materia(s):
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-Àrees temàtiques de la UPC::Informàtica::Informàtica teòrica -Linear programming -Computational complexity -Graph theory -Logic gates -Integrated circuit modeling -Complexity theory -Vocabulary -Optimization -Q measurement -Programació lineal -Complexitat computacional -Grafs, Teoria de |
Derechos:
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Tipo de documento:
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Artículo - Versión presentada Objeto de conferencia |
Editor:
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Institute of Electrical and Electronics Engineers (IEEE)
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