Title:
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Soft Error Rate Analysis in Combinatorial Logic
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Author:
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Anglada Sánchez, Martí
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Other authors:
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González Colás, Antonio María; Canal Corretger, Ramon |
Abstract:
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We develop a simple model that computes the probability that a strike at the output of a gate has an impact in any output by traversing the circuits backwards from the outputs and gaining information about the logical masking using signal probabilities. The model is validated with fault injection |
Subject(s):
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-Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors -Integrated circuits -Soft error -SER -fiabilitat -emmascarament lògic -circuits -reliability -logical masking -circuits -Circuits integrats |
Rights:
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Document type:
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Research/Master Thesis |
Published by:
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Universitat Politècnica de Catalunya
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