Temperature sensors and measurements to test analogue circuits: questions and answers

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dc.contributor	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor	Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.contributor	Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics
dc.contributor.author	Altet Sanahujes, Josep
dc.contributor.author	Rubio Sola, Jose Antonio
dc.contributor.author	Reverter Cubarsí, Ferran
dc.contributor.author	Perpiñà Gilabet, Xavier
dc.contributor.author	Aragonès Cervera, Xavier
dc.contributor.author	Jordà, Xavier
dc.contributor.author	Vellvehi, Miquel
dc.contributor.author	Mateo Peña, Diego
dc.date	2016
dc.identifier.citation	Altet, J., Rubio, A., Reverter, F., Perpiñà, X., Aragones, X., Jordà, X., Vellvehi, M., Mateo, D. Temperature sensors and measurements to test analogue circuits: questions and answers. A: International Mixed-Signal Testing Workshop. "2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016". Sant Feliu de Guixols, Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2016.
dc.identifier.citation	978-1-5090-2751-4
dc.identifier.citation	10.1109/IMS3TW.2016.7524241
dc.identifier.uri	http://hdl.handle.net/2117/97135
dc.language.iso	eng
dc.publisher	Institute of Electrical and Electronics Engineers (IEEE)
dc.relation	http://ieeexplore.ieee.org.recursos.biblioteca.upc.edu/stamp/stamp.jsp?arnumber=7524241
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors
dc.subject	Integrated circuits
dc.subject	Temperature measurements
dc.subject	Analogue circuits
dc.subject	Integrated circuit testing
dc.subject	Temperature measurement
dc.subject	Temperature sensors
dc.subject	Temperature sensors
dc.subject	Analogue circuits
dc.subject	Temperature measurements
dc.subject	Integrated circuits
dc.subject	Circuits integrats
dc.subject	Termometria
dc.title	Temperature sensors and measurements to test analogue circuits: questions and answers
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/conferenceObject
dc.description.abstract	We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many interesting questions, some of them collected more than once!. Here you have some of them. Our goal in this paper is to introduce temperature measurements and temperature sensors to test analog circuits from the highest level of abstraction. This paper has been written with the goal to provide basic understanding and present some of the possibilities of temperature sensors and measurements to test integrated circuits in general, analog in particular.
dc.description.abstract	Peer Reviewed

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