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Volumetric testing for the nonconforming discretization of integral equations in scattering problems
Úbeda Farré, Eduard; Sekulic, Ivan; Rius Casals, Juan Manuel; Heldring, Alexander
Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. ANTENNALAB - Grup d'Antenes i Sistemes Radio
The traditional discretizations of the electric-field integral equation (EFIE) impose the continuity of the normal component current across the edges in the meshing. These edgeoriented schemes become awkward in the analysis of composite objects or of closed conductors meshed with nonconformal meshes. In this context, the nonconforming expansion of the current with facet-oriented schemes, like the monopolar-RWG set, with no imposed interelement continuity, leads to EFIEimplementations with enhanced versatility. However, the traditional Galerkin method-of-moment implementation gives rise to hypersingular Kernel contributions, which cannot be evaluated numerically. Recently, we have proposed a nonconforming monopolar-RWG discretization of the EFIE where the testing is carried out over volumetric elements attached to the surface triangulation inside the object under analysis. In this paper, we review the so-called volumetric monopolar-RWG discretization of the EFIE with testing over tetrahedral or wedge elements. These schemes show improved accuracy, when compared with the RWG-discretization, for a particular range of heights of the testing elements. As we show in this paper, this range becomes wider for the wedge testing choice than with the tetrahedral choice.
Peer Reviewed
-Àrees temàtiques de la UPC::Matemàtiques i estadística::Equacions diferencials i integrals
-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica
-Integral equations
-Moments method (Statistics)
-Electric fields
-Integral equations
-Moment method
-Basis functions
-Electric field integral equation
-Equacions integrals
-Camps elèctrics
Artículo - Versión publicada
Objeto de conferencia
Institute of Electrical and Electronics Engineers (IEEE)
         

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